The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2013

Filed:

Mar. 04, 2010
Applicants:

Jianfeng Yan, Shanghai, CN;

Wen-syan LI, Shanghai, CN;

Inventors:

Jianfeng Yan, Shanghai, CN;

Wen-Syan Li, Shanghai, CN;

Assignee:

SAP AG, Walldorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A first performance measurement of an executing task may be determined, while the task is executed by a first number of nodes operating in parallel. A second performance measurement of the executing task may be determined, while the task is being executed by a second number of nodes operating in parallel. An overhead factor characterizing a change of a parallelism overhead of executing the task with nodes executing in parallel may then be calculated, relative to a change in a number of the nodes, based on the first performance measurement and the second performance measurement. Then, an optimal number of nodes to operate in parallel to continue executing the task may be determined, based on the overhead factor.


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