The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8612174 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 17, 2013

Filed:

Mar. 07, 2011
Applicant:

Viswanathan Madhavan, Gaithersburg, MD (US);

Inventor:

Viswanathan Madhavan, Gaithersburg, MD (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 9/00 (2006.01);
U.S. Cl.
CPC ...
G01C 9/00 (2013.01);
Abstract

A method and apparatus is disclosed that modulates the position of one target tracked by a position measuring instrument, measures the path of the target, fits the parameters of a mathematical representation of the time varying path to the path of the target measured as a function of time, and obtains the position, orientation and velocity of the object on which the apparatus is mounted. Key aspects of the modulating nest and the improved method for determining the best fit mathematical representation of the path of the target resulting from the combined effect of the modulation and the motion of the object are disclosed.


Find Patent Forward Citations

Madhavan, Viswanathan. (2013). Method and apparatus for dynamic 6dof measurement (U.S. Patent No. 8612174). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8612174

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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