The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2013
Filed:
Mar. 14, 2011
Osamu Furuhashi, Uji, JP;
Kiyoshi Ogawa, Kizugawa, JP;
Shigeki Kajihara, Uji, JP;
Tohru Kinugawa, Osaka, JP;
Osamu Furuhashi, Uji, JP;
Kiyoshi Ogawa, Kizugawa, JP;
Shigeki Kajihara, Uji, JP;
Tohru Kinugawa, Osaka, JP;
Shimadzu Corporation, Kyoto-Shi, JP;
Abstract
A method creates an accurate mass spectrum with a high resolving power based on a plurality of TOF spectra, while reducing the computation to assure real-time processing. TOF spectra are measured when ions are ejected from the loop orbit. Then a coincidence detection method determines what mass-to-charge ratio a peak appearing on the TOF spectra originates from. The time range in which a corresponding peak appears on other TOF spectra is set, and the existence of the peak in that range is determined. When the corresponding peak is found on other TOF spectra, the m/z is deduced from the peak on the TOF spectrum with the highest resolving power and a mass spectrum is created. From the peak density around the peak of interest, the reliability of the deduction is computed. For a low reliability peak, the ion ejection time is optimized and the TOF spectrum is measured again.