The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2013

Filed:

Dec. 31, 2010
Applicant:

Michael Francis Van Leeuwen, Bethseda, MD (US);

Inventor:

Michael Francis Van Leeuwen, Bethseda, MD (US);

Assignee:

Infinera Corporation, Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04J 14/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present disclosure provides a system, apparatus and method to provide for monitoring of characteristics of optical signals, as part of wavelength division multiplexed signals for example, transmitted over a network infrastructure. The characteristics of each optical signal may be monitored and maintained at desired values in order to optimize system performance. A system including a coherent detector, as part of a coherent receiver for example, may be employed to associate each transmitted optical signal with a modulated source. Control signals generated by the system can then be provided to elements of the modulated source to control characteristics, such as optical power, optical frequency, and optical phase, for example, of the transmitted optical signal.


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