The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2013
Filed:
Jul. 22, 2010
Meng Yao, West Linn, OR (US);
Xing LI, Webster, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
A methodology for thin line detection and enhancement in electronic images is disclosed. The methodology includes associating an electronic image with at least one basic context window that is less than the size of the electronic image based on the input image resolution of the electronic image; detecting one or more predefined patterns which correspond to thin lines in the electronic image using the at least one basic context window; excluding patterns for the one or more detected patterns which are halftone patterns; and adding at least one pixel to the electronic image based on at least one of the remaining patterns so as to enhance thin line features in the electronic image. In some implementation, the methodology may be configured to handle electronic images having different resolutions. A system for thin line detection and enhancement in electronic images having different resolutions is also disclosed.