The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2013

Filed:

Nov. 21, 2011
Applicants:

Shang-hsuan Tsai, Stanford, CA (US);

Vasudev Parameswaran, Fremont, CA (US);

Radek Grzeszczuk, Menlo Park, CA (US);

Inventors:

Shang-hsuan Tsai, Stanford, CA (US);

Vasudev Parameswaran, Fremont, CA (US);

Radek Grzeszczuk, Menlo Park, CA (US);

Assignee:

Nokia Corporation, Espoo, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A digital image is converted to a multiple level image, and multiple scale sets are formed from connected components of the multiple level image such that different ones of the scale sets define different size spatial bins. For each of the multiple scale sets there is generated a count of connected components extracted from the respective scale set for each spatial bin; and adjacent spatial bins which represent connected components are linked. Then the connected components from the different scale sets are merged and text line detection is performed on the merged connected components. In one embodiment each of the scale sets is a histogram, and prior to linking all bins with less than a predetermined count are filtered out; and each histogram is extended such that counts of adjacent horizontal and vertical bins are added (single region bins are filtered out) and the linking is on the extended histograms.


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