The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2013

Filed:

Jul. 01, 2011
Applicants:

Nir Karasikov, Haifa, IL;

Jona Sela, Tel Aviv, IL;

Uri Dubin, Haifa, IL;

Gal Goshen, Jerusalem, IL;

Inventors:

Nir Karasikov, Haifa, IL;

Jona Sela, Tel Aviv, IL;

Uri Dubin, Haifa, IL;

Gal Goshen, Jerusalem, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention discloses a method for detecting and identifying pathologies in a magnified captured image. The method comprising the step of: performing macro image analysis for identifying abnormal and normal segments of the captured image, performing conversion of colored images to gray scale image, performing segmentation of the gray scale colored biopsy by applying two segmentation levels, merging the image results of the coarse level and the fine level segmentations by expanding the coarse image to fit scale of the fine image and identifying pixels having the same value at both levels, performing comparison between object's properties and characteristics appearing in abnormal segments and object's properties and characteristics appearing in normal segments, and calculating the deviations of each property between the abnormal segments and the normal segments and ranking objects based on the calculated deviations of each property and characteristic.


Find Patent Forward Citations

Loading…