The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2013
Filed:
May. 31, 2010
Masatoshi Yokokawa, Kanagawa, JP;
Kazuki Aisaka, Kanagawa, JP;
Jun Murayama, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
The present invention relates to an image processing apparatus and method, and a program that are capable of more appropriately evaluating the image-capture state of an image. A blur degree score calculation unitthrough to a chroma score calculation unitextract a feature quantity of a pre-specified feature from an input image, and calculate a feature-by-feature score indicating an evaluation for the input image on the basis of the feature. For example, the luminance score calculation unitextracts, as a feature quantity, a luminance value from the input image, and calculates a luminance score indicating an evaluation based on the distribution of the luminance values in the subject portion of the input image. The overall score calculation unitcalculates an overall score indicating the evaluation of the image-capture state of the input image from each feature-by-feature score. As described above, when each feature-by-feature score is to be calculated, by extracting each feature quantity and obtaining a score from the area of the input image suitable for the feature, it is possible to more appropriately evaluate the input image. The present invention can be applied to an image processing apparatus.