The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2013

Filed:

Aug. 25, 2010
Applicants:

Alexander David Wallace, Sunnyvale, CA (US);

Tim Cherna, San Francisco, CA (US);

Eric Hanson, Emeryville, CA (US);

Nikhil Bhatt, Cupertino, CA (US);

Inventors:

Alexander David Wallace, Sunnyvale, CA (US);

Tim Cherna, San Francisco, CA (US);

Eric Hanson, Emeryville, CA (US);

Nikhil Bhatt, Cupertino, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods, systems, and apparatus are presented for associating a point of interest with a captured image. In one aspect, metadata associated with a digital image can be accessed, the metadata identifying an image capture location. Further, a depth of field corresponding to the digital image can be determined and one or more points of interest can be identified that are located within the determined depth of field. Additionally, one of the one or more identified points of interest can be selected as an image subject and the metadata associated with the digital image can be edited to include data identifying the selected point of interest.


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