The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2013
Filed:
Sep. 15, 2010
Michael Brodsky, Millburn, NJ (US);
Cristian Antonelli, Sulmona, IT;
Jungmi OH, Daejeon, KR;
AT&T Intellectual Property I, L.P., Atlanta, GA (US);
Abstract
A quantum key distribution system comprises a source of entangled photon pairs and two single-photon detectors. The source is coupled to each of the single-photon detectors by optical fiber. Operational systems parameters include the efficiency of the first single-photon detector, the efficiency of the second single-photon detector, and the maximum average number of photon pairs per unit time generated by the source. To characterize the operational systems parameters, the transmittances between the source and each single-photon detector are determined. The dark count probability of the first single-photon detector and the dark count probability of the second single-photon detector are determined. The count probability at the first single-photon detector, the count probability at the second single-photon detector, and the coincidence count probability are determined as a function of the optical power from the source. By fitting the values to a set of relationships, the operational systems parameters are computed.