The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2013

Filed:

Oct. 13, 2010
Applicants:

Dong Myoung Baek, Daejeon, KR;

Bhum Cheol Lee, Daejeon, KR;

Jung Hee Lee, Daejeon, KR;

Sang Yoon OH, Daejeon, KR;

Seung-woo Lee, Daejeon, KR;

Inventors:

Dong Myoung Baek, Daejeon, KR;

Bhum Cheol Lee, Daejeon, KR;

Jung Hee Lee, Daejeon, KR;

Sang Yoon Oh, Daejeon, KR;

Seung-Woo Lee, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is an apparatus and method for inspecting a multi-layer packet. The apparatus may include a lower layer processing unit to generate lower layer hash information based on a lower layer packet of the multi-layer packet, and to perform a first processing with respect to a flow of the multi-layer packet, in association with the generated lower layer hash information, and a higher layer preprocessing unit to perform a second processing with respect to a flow of the multi-layer packet where the first processing is performed, in association with the lower layer hash information.


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