The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2013
Filed:
May. 06, 2010
Vishnu Vardhan Krishnamachari, Mannheim, DE;
William C. Hay, Heppenheim, DE;
Vishnu Vardhan Krishnamachari, Mannheim, DE;
William C. Hay, Heppenheim, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE (US);
Abstract
A tunable multiple laser pulse scanning microscope and a method of operating the same is described, applying two pulsed laser beams with distinct wavelengths incident on a scanning spot of a sample to be imaged simultaneously or at a specific time delay. The microscope comprises at least two pulsed laser light sources emitting laser light of distinct wavelengths, an acousto-optic tunable filter (AOTF) for tuning at least one of the laser pulses, a delay stage provided upstream of the AOTF, and an actuator for moving delay stage depending on the time delay. As a result, the wavelength of at least one type of pulses is tuned, and the delay between at least two pulses of distinct wavelengths is adjusted.