The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2013

Filed:

Aug. 24, 2011
Applicants:

Douglas E. Proctor, Rochester, NY (US);

Robert Paul Herloski, Webster, NY (US);

Inventors:

Douglas E. Proctor, Rochester, NY (US);

Robert Paul Herloski, Webster, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining a flatness characteristic for a facet of a polygon assembly includes a) rotating a polygon assembly with facets at a desired speed, b) directing a light beam from a light source toward the polygon assembly so light is reflected by consecutive facets during revolutions of the polygon assembly, reflected light passing through a focusing lens that directs a spot light toward a target with spaced-apart bars arranged in a grating pattern that block a portion of the reflected light and allows another portion to pass through another focusing lens that directs another spot light toward a light sensor, the light sensor detecting intensity of the spot light, and c) measuring the intensity over time during revolutions of the polygon assembly to obtain measurements for each facet. An associated test setup includes a fixture, motor controller, light source, light sensor, two focusing lens, target, and system controller.


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