The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2013

Filed:

Jan. 11, 2012
Applicants:

Hee Tae Jung, Daejeon, KR;

Yun Ho Kim, Chuncheon-si, KR;

Dae Woo Kim, Gochang-gun, KR;

Hyeon Su Jeong, Samcheok-si, KR;

Inventors:

Hee Tae Jung, Daejeon, KR;

Yun Ho Kim, Chuncheon-si, KR;

Dae Woo Kim, Gochang-gun, KR;

Hyeon Su Jeong, Samcheok-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method for optical visualization of graphene domains, and more particularly to a method for optical visualization of graphene domains, which can optically visualize the domains and domain boundaries of graphene by forming on a substrate a graphene layer to be measured, forming a liquid crystal layer on the formed graphene layer, and then measuring the optical properties of the formed nematic liquid crystal layer. The method for optical visualization of graphene domains according to the invention uses a liquid crystal-coating method, which is simpler and easier than a conventional method for observing graphene domains. Thus, the method of the invention is simple, time-saving and inexpensive and, at the same time, enables very-large-area graphene domains to be observed with a polarizing microscope or the like. Therefore, the inventive method will be very useful in the research of graphene's properties.


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