The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2013
Filed:
Dec. 02, 2008
Quan Jiang, Singapore, SG;
Chao BI, Singapore, SG;
Song Lin, Singapore, SG;
Agency for Science, Technology and Research, Singapore, SG;
Abstract
A runout measurement system is proposed for measuring the runout of a moving surface of a device having a rotating body, such as a mass storage device () (e.g. a hard disk drive) having a rotor which in use includes a rotating recording medium. A sensor () interacting with the moving surface obtains a displacement signal. The displacement signal is sampled by a sampling unit () controlled by a unit () which initiates sampling based on both a signal indicating a ZCP and the clock signal of a high frequency (e.g. 20 MHz) clock (). Simultaneously, the same clock () is used by a counterto measure the spacing between one or more ZCP times. This permits the correspondence between the sampling times and the angular position of the rotor to be found with a high accuracy which depends upon the clock frequency, and thereby allows calculation of repeatable runout (RRO) and non-repeatable runout (NRRO).