The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2013

Filed:

Jan. 27, 2012
Applicants:

Eiji Yamamoto, Musashimurayama, JP;

Aiko Yoshida, Higashimurayama, JP;

Inventors:

Eiji Yamamoto, Musashimurayama, JP;

Aiko Yoshida, Higashimurayama, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/347 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical displacement detection apparatus includes a scale and a sensor head. The scale has a first and second pattern. The head includes a first photodetector that detects a beam through the first pattern and generates a first signal, and a second photodetector that detects the beam through the second pattern and generates a second signal. The first and second signals include a first component, and a second component that corresponds to an absolute displacement of the scale. The first pattern, the second pattern, the first photodetector, the second photodetector, and a beam source are disposed such that the detection of the first photodetector and the detection of the second photodetector are performed correlatively.


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