The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2013
Filed:
Jan. 28, 2010
Keiji Tsukada, Okayama, JP;
Keiji Tsukada, Okayama, JP;
National University Corporation Okayama University, Okayama, JP;
Abstract
Provided is an ion sensor with which the concentration of ions in a solution can be determined without any reference electrode. The ion sensor is equipped with: a first electrode plate; a second electrode plate which has been disposed opposite the first electrode plate and has one or multiple openings; an ion-sensitive film continuously formed so that the film is interposed between the first electrode plate and the second electrode plate, blocks up one side of each opening of the second electrode plate, and extends from the end of that side of the opening to the outer surface of the second electrode plate through the inner wall surface of the opening; and a sensor support which supports the second electrode plate so that when the ion concentration of a test solution to be examined is determined, the ion-sensitive film comes into contact with the test solution only in the portions thereof that have been formed in each opening and on the outer surface of the second electrode plate. The ion sensor is configured so that the thickness of the ion-sensitive film interposed between the first electrode plate and the second electrode plate is different from the thickness of the ion-sensitive film formed on the outer surface of the second electrode plate. A difference in potential between the first electrode plate and the second electrode plate is measured.