The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
Jun. 11, 2009
Paul F. Mcmahan, Durham, NC (US);
Sachin P. Patel, Durham, NC (US);
John P. Whitfield, Waltham, MA (US);
David Colasurdo, Durham, NC (US);
Paul F. McMahan, Durham, NC (US);
Sachin P. Patel, Durham, NC (US);
John P. Whitfield, Waltham, MA (US);
David Colasurdo, Durham, NC (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Described is a method for managing test artifacts. According to an embodiment of the method, a test plan for a product is selected by a user. The test plan has multiple test artifacts that include the test plan and at least one of a test case, an execution record defining a configuration of the product, and a product requirement. One of the test artifacts is selected for a snapshot and the snapshot is acquired. The snapshot acquisition includes storing a current state of the selected test artifact, storing a current state of relationships of the selected test artifact to the other test artifacts, and storing a current state of the other test artifacts that have a relationship with the selected test artifact.