The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
Apr. 19, 2010
Andrew Crosland, Aylesbury, GB;
Adam Titley, Warfield, GB;
Andrew Crosland, Aylesbury, GB;
Adam Titley, Warfield, GB;
Altera Corporation, San Jose, CA (US);
Abstract
Techniques and circuits for testing a memory are provided. The techniques include disabling a plurality of interrupts to an integrated circuit (IC). Contents of a first memory region to be tested are copied to a second memory region. The second memory region where the contents are copied to is a safe memory region that will not be affected by the memory test. Memory accesses are mapped to the second memory region so that memory accesses that are associated with the first memory region are mapped to the second memory region. The plurality of interrupts is re-enabled after the memory contents in the first memory region are copied and remapped to the second memory region. Memory accesses due to the interrupts are redirected from the first memory region to the second memory region according to the memory mapping. The first memory region is tested with a test circuit of the IC.