The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2013

Filed:

Jul. 19, 2010
Applicants:

Byoung Ju Choi, Seoul, KR;

Joo Young Seo, Seoul, KR;

Seung Wan Yang, Gyeonggi-Do, KR;

Hae Young Kwon, Gyeonggi-Do, KR;

Inventors:

Byoung Ju Choi, Seoul, KR;

Joo Young Seo, Seoul, KR;

Seung Wan Yang, Gyeonggi-Do, KR;

Hae Young Kwon, Gyeonggi-Do, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention features an operational system test method, comprising defining a fault model, inserting a test agent, hooking a test location, collecting test information, and removing the test agent. The invention also features an operational system test method, comprising defining a fault model, inserting a test agent, identifying a memory area according to a test location, hooking the identified memory area, collecting test information, and removing the test agent.


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