The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2013

Filed:

Nov. 10, 2010
Applicants:

Richard J. Kenefic, Fort Wayne, IN (US);

David W. Shin, Fort Wayne, IN (US);

Saad Karim, Cary, NC (US);

Inventors:

Richard J. Kenefic, Fort Wayne, IN (US);

David W. Shin, Fort Wayne, IN (US);

Saad Karim, Cary, NC (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is an efficient and configurable apparatus and method for sample rate conversion using interpolation. The apparatus and method employ a configuration file to change the conversion coefficients, sampling rate, and interpolation algorithm without having to recompile control software and/or reprogram the controlled device. In some embodiments, the interpolation employs polynomial interpolation, which may include Lagrange interpolation. In some embodiments, the interpolation method is selected to minimize the loop delay in teleoperation applications.


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