The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8606810 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 10, 2013

Filed:

Jan. 30, 2009
Applicants:

Shinichi Ando, Tokyo, JP;

Satoshi Nakazawa, Tokyo, JP;

Toshio Takeda, Kanagawa, JP;

Inventors:

Shinichi Ando, Tokyo, JP;

Satoshi Nakazawa, Tokyo, JP;

Toshio Takeda, Kanagawa, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are a related expression generation section that accepts an evaluation object expression, an linguistic expression to be evaluated, as input and generates a linguistic expression related to the evaluation object expression as a related expression; and a credibility calculation section that acquires the evaluation object expression and the related expression from a plurality of electronic documents along with time information and calculates credibility concerning the meaning of the evaluation object expression at a specific point in time by comparing the number of times that the acquired evaluation object expression appears and the number of times that the acquired related expression appears at the same time point.


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Ando, Shinichi. (2013). Information analyzing device, information analyzing method, information analyzing program, and search system (U.S. Patent No. 8606810). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8606810

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