The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
Sep. 14, 2012
Mondher Ben-hamida, Chicago, IL (US);
Chad Boucher, Concord, NC (US);
Paolina Centonze, Amawalk, NY (US);
Mary E. Helander, North White Plains, NY (US);
Kaan K. Katircioglu, Yorktown Heights, NY (US);
Karthik Sourirajan, White Plains, NY (US);
Mondher Ben-Hamida, Chicago, IL (US);
Chad Boucher, Concord, NC (US);
Paolina Centonze, Amawalk, NY (US);
Mary E. Helander, North White Plains, NY (US);
Kaan K. Katircioglu, Yorktown Heights, NY (US);
Karthik Sourirajan, White Plains, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Embodiments of the invention provide a method, system and computer program product for carbon management for sourcing and logistics. In one embodiment, the method comprises using a computer for quantifying both a cost and a carbon impact of one or more logistics policies relating to a manufacturing process; and minimizing the cost and carbon impact using a defined equation including a first component representing a transportation cost, and a second component representing a carbon cost. In an embodiment of the invention, the quantifying includes using an analytics engine to quantify the cost and carbon impact. The analytics engine may include a shipment analysis module to calculate an optimal transportation policy, a sourcing analysis module for testing alternate sourcing options, a scenario analysis module to find an optimal order frequency, and a sensitivity analysis module to test the impact of various changes.