The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
Jun. 07, 2011
Christoph Klawun, Bartlesville, OK (US);
Aosheng Wang, Eden Prairies, MN (US);
Christoph Klawun, Bartlesville, OK (US);
Aosheng Wang, Eden Prairies, MN (US);
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method for quantifying peaks in an analytical signal, peaks in the analytical signal being quantified by recording successive signal values and applying a peak analysis methodology to the recorded successive signal values within an interval to obtain a set of peak quantification results. Before the same peak analysis methodology is applied to the modified signal to quantify the peaks in the signal, random noise is added to the analytical signal and/or the signal is shifted within the interval to facilitate optimization of the parameters of the peak analysis methodology and to improve the robustness of the method in runtime applications. A subsequent statistical evaluation of the peak quantification results from the multiple repeated peak analyses of the original and modified signals is used to detect an occurrence of and to reduce the chance of a possible error in the peak quantification that needs to be alarmed or addressed.