The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
Apr. 06, 2011
Shunji Hiwatashi, Tokyo, JP;
Shigeru Yonemura, Tokyo, JP;
Shunji Hiwatashi, Tokyo, JP;
Shigeru Yonemura, Tokyo, JP;
Nippon Steel & Sumitomo Metal Corporation, Tokyo, JP;
Abstract
A fracture determination method for determining a fracture of a metal structure includes, when a fracture determination target portion has returned from a plastic state to an elastic state, given that a stress when the portion returned to the elastic state is (x, y)=(σ) (maximum principal stress: σ, minimum principal stress: σ) on a (x, y) coordinate plane, performing fracture determination of the fracture determination target portion using a re-yield stress R determined by the intersection between a straight line satisfying a relation y=(σ)x and an yield curve obtained from the plastic state of the fracture determination target portion. Fracture determination can be performed with high accuracy even when the fracture determination target portion has returned from a plastic state to an elastic state.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile