The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
Jan. 19, 2007
Applicants:
Thirumalarao Voonna, Garland, TX (US);
Jasmin Oz, Plano, TX (US);
Eran Pisek, Plano, TX (US);
Thomas M. Henige, Dallas, TX (US);
Inventors:
Thirumalarao Voonna, Garland, TX (US);
Jasmin Oz, Plano, TX (US);
Eran Pisek, Plano, TX (US);
Thomas M. Henige, Dallas, TX (US);
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01);
U.S. Cl.
CPC ...
Abstract
A method for testing a software-defined radio (SDR) device is provided. The method includes configuring the SDR device for a first standard. A first test is performed on the SDR device under the first standard. Test data for the first test is received from the SDR device. A switching time for configuring the SDR device for the first standard is determined based on the test data for the first test.