The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2013

Filed:

Dec. 27, 2011
Applicants:

Yuichi Tsujita, Ibaraki, JP;

Mayu Takase, Ibaraki, JP;

Inventors:

Yuichi Tsujita, Ibaraki, JP;

Mayu Takase, Ibaraki, JP;

Assignee:

Nitto Denko Corporation, Ibaraki-shi, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/036 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a manufacturing method for an optical waveguide in which, when the optical waveguide is cut and a contour thereof is processed, accuracy of a cut position is improved by improving visibility of an alignment mark. An undercladding layer, cores, and alignment marks are formed on a front surface of a substrate. Then, an overcladding layer is formed using a photomask so as to cover the cores with the alignment marks being exposed. After the substrate is separated to manufacture an optical waveguide body, a cut position is located with reference to the alignment marks from a rear surface side of the undercladding layer, and the undercladding layer and the overcladding layer are cut to manufacture the optical waveguide.


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