The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
Apr. 21, 2008
Toshio Kamei, Tokyo, JP;
Toshio Kamei, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
A 2-dimensional pattern matching method contains a process of extracting a query feature data by projecting a vector representation of either of a query 2-dimensional pattern and a transformed query 2-dimensional pattern which is generated by transforming the query 2-dimensional pattern, to a feature space. An enrollment feature data as previously enrolled and a query feature data are inversely projected to the 2-dimensional pattern representation space which has the dimension of the vector representation and the similarity is calculated. The data size of a feature amount is small and a matching technique robust to the positional displacement and the image distortion is provided.