The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2013

Filed:

Dec. 21, 2011
Applicants:

Konstantin Anisimovich, Moscow, RU;

Dmitry Deryagin, Moscow, RU;

Vladimir Rybkin, Moscow, RU;

Inventors:

Konstantin Anisimovich, Moscow, RU;

Dmitry Deryagin, Moscow, RU;

Vladimir Rybkin, Moscow, RU;

Assignee:

ABBYY Development LLC, Moscow, RU;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a method of bit-mapped image analysis that comprises a whole image data representation via its component objects. The objects are assigned to different levels of complexity. The objects may be hierarchically connected by spatially-parametrical links. The method comprises preliminarily generating a classifier of image objects consisting of one or more levels differing in complexity; parsing the image into objects; attaching each object to one or more predetermined levels; establishing hierarchical links between objects of different levels; establishing links between objects within the same level; and performing an object feature analysis. Object feature analysis comprises generating and examining a hypothesis about object features and correcting the concerned object's features of the same and other levels in response to results of hypothesis examination. Object feature analysis may also comprise execution of a recursive X-Y cut within the same level.


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