The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
Aug. 16, 2011
Aniruddha Haldar, West Bengal, IN;
Srinivas Eppa, Bangalore, IN;
Venkatesh Deshpande, Bangalore, IN;
Srinivas Vura, San Jose, CA (US);
Shanmugavel Murugesan, Bangalore, IN;
Aniruddha Haldar, West Bengal, IN;
Srinivas Eppa, Bangalore, IN;
Venkatesh Deshpande, Bangalore, IN;
Srinivas Vura, San Jose, CA (US);
Shanmugavel Murugesan, Bangalore, IN;
LSI Corporation, San Jose, CA (US);
Abstract
Hardware-based methods and apparatus are provided for training high speed data links used in data transfer applications. A data valid window is calibrated on one or more high speed links by determining an offset delay value for at least one datapath using a finite state machine, wherein the offset delay value is based on a maximum offset delay value and a minimum offset delay value for the at least one datapath; and delaying a read data strobe signal based upon a base delay and the offset delay value for the at least one datapath. The offset delay value can be, for example, an average of the maximum offset delay and the minimum offset delay. The received pattern can be a predefined pattern or a programmable pattern. In addition, the received pattern can cover single-bit transitions and/or multi-bit transitions.