The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
May. 31, 2011
Peter Huber, Neubiberg, DE;
Joel Hatsch, Holzkirchen, DE;
Karl Hofmann, Munich, DE;
Siegmar Koeppe, Munich, DE;
Peter Huber, Neubiberg, DE;
Joel Hatsch, Holzkirchen, DE;
Karl Hofmann, Munich, DE;
Siegmar Koeppe, Munich, DE;
Infineon Technologies AG, Neubiberg, DE;
Abstract
Rather than merely carrying out a BIST test by verifying whether a memory cell accurately stores a '1' or '0' under normal read/write conditions, aspects of the present discloser relate to BIST tests that test the read and/or write margins of a cell. During this BIST testing, the read and/or write margins can be incrementally stressed until a failure point is determined for the cell. In this way, “weak” memory cells in an array can be identified and appropriate action can be taken, if necessary, to deal with these weak cells.