The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
May. 23, 2010
Josh N Hogan, Los Altos, CA (US);
Josh N Hogan, Los Altos, CA (US);
Other;
Abstract
A non-invasive imaging and analysis method and system/apparatus suitable for non-invasive imaging and analysis of a target is disclosed. Targets include biological tissue structures or components; optical structures or components; electronic structures or components; or structures in general. A preferred embodiment of the invention provides a precision optical measuring module that modifies the spatial separation of multiple reference interference signals by adjusting the separation between a partial reflective element and a full mirror mounted on a piezo device and determining the distance between surfaces or structures within the target by simultaneously monitoring the magnitude of the separation between the partial reflective element and the full mirror and processing generated interference signals. Techniques for simultaneously monitoring the magnitude of the separation between the partial reflective element and the full mirror include conventional measurement techniques, such as, capacitive, optical, or strain techniques or alternatively the use of one or more etalons. Another embodiment of the invention provides a system and method of precisely measuring the position of a surface of interest.