The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2013

Filed:

Sep. 09, 2011
Applicants:

Yoichi Toriumi, Tokyo, JP;

Hideo Kawabe, Saitama, JP;

Kenichi Kabasawa, Saitama, JP;

Tatsuya Suzuki, Kanagawa, JP;

Hirokazu Imai, Chiba, JP;

Masatoshi Ueno, Kanagawa, JP;

Inventors:

Yoichi Toriumi, Tokyo, JP;

Hideo Kawabe, Saitama, JP;

Kenichi Kabasawa, Saitama, JP;

Tatsuya Suzuki, Kanagawa, JP;

Hirokazu Imai, Chiba, JP;

Masatoshi Ueno, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measurement device includes a light sensing element on which light from a measurement target region placing a measurement target thereon forms an image, and a plurality of light emitting elements that are disposed around the light sensing element and radiate light to the measurement target region, wherein the plurality of light emitting elements are disposed to be tilted with respect to the normal line of the measurement target region such that the central line of radiated emission from each of the light emitting elements passes through a substantial center of the measurement target region.


Find Patent Forward Citations

Loading…