The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2013

Filed:

Apr. 26, 2012
Applicant:

Fedor Ilkov, San Jose, CA (US);

Inventor:

Fedor Ilkov, San Jose, CA (US);

Assignee:

EMD Millipore Corporation, Billerica, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a particle analyzing apparatus including a capillary for passing through a fluid containing particles to be analyzed, an optical system is employed to collect fluorescent light emitted from particles or substances labeled to the particles with improved collection efficiency preserving resolution of the instrument. The optical system may include a first collection lens attached to the capillary and a first reflection element arranged adjacent to the first collection lens configured to reflect fluorescent light of one or more wavelengths. The optical system may include a second collection lens attached to the capillary and a second reflection element arranged adjacent to the second collection lens configured to reflect fluorescent light of one or more wavelengths.


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