The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
Aug. 02, 2012
Chih-kuang Chang, New Taipei, TW;
Zhong-kui Yuan, Shenzhen, CN;
Jian-hua Liu, Shenzhen, CN;
Xiao-guang Xue, Shenzhen, CN;
Dong-hai LI, Shenzhen, CN;
Chih-Kuang Chang, New Taipei, TW;
Zhong-Kui Yuan, Shenzhen, CN;
Jian-Hua Liu, Shenzhen, CN;
Xiao-Guang Xue, Shenzhen, CN;
Dong-Hai Li, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Abstract
In a precision testing method of an optical lens using a computing device, the computing device is connected to an imaging system. The computing device controls the imaging system to generate an image of an object according to light rays reflected from the object and collected by the optical lens. A dimension of the object is measured from the image. A maximum value and a minimum value of the dimension of the object are determined. A difference between the maximum value and the minimum value is calculated. According to the difference, it is determined whether the optical lens agrees with a precision requirement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile