The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
Nov. 28, 2008
Yusuke Hayashi, Tokyo, JP;
Naoto Ohara, Tokyo, JP;
Tomoya Sugita, Tokyo, JP;
KYOCERA Corporation, Kyoto, JP;
Abstract
An imaging apparatus includes an aberration control optical system having an aberration control function to intentionally generate an aberration and an imaging device; and an image processing device which forms a first image into a highly accurate final image. An aberration control optical system makes the PSF to cover two or more pixels by using the aberration control optical system containing an aberration control element having an aberration control function to intentionally generate an aberration or an aberration control plane having the aberration control function. The aberration control optical system is formed as a depth extension optical system having two or more peaks of the MTF characteristic for defocus in a main image plane shift region not causing a false resolution in a predetermined frequency.