The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
Apr. 12, 2011
Hirokazu Kameyama, Kanagawa-ken, JP;
Hirokazu Kameyama, Kanagawa-ken, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
When Npairs of sample data are inputted, pre-processing and area division processing are performed by a pre-processing means and area division means respectively. Thereafter, when number of classes Nis inputted to projection matrix generation means based on the Npairs of sample data, clustering in which Npairs of sample data are classified into Nclasses. Then, representative sample data representing each of classes (Nclasses) are selected from Npairs of sample data as the learning data. Then, based on the nature of Formula (2), calculation means generates an inverse first projection matrix (M)using a plurality of low resolution sample images (pre-transformation sample data) of a plurality of pairs of representative sample data and a second projection matrix Musing a plurality of high resolution sample images (post-transformation sample data). Thereafter, a transformation matrix {M·(M)} is generated by transformation matrix generation means.