The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
Aug. 26, 2009
Mitsuhiro Shimotomai, Tokyo, JP;
Hikaru Ichimura, Tokyo, JP;
Mitsuhiro Shimotomai, Tokyo, JP;
Hikaru Ichimura, Tokyo, JP;
Nisshinbo Holdings Inc., Tokyo, JP;
Abstract
Provided is an inspecting apparatus for inspecting a photovoltaic devices by applying a current to the photovoltaic devices in a forward direction to make the photovoltaic devices emit EL light which is simple in structure and capable of shortening inspection time in inspecting a defect from a photographed image with a perfect resolution. The inspecting apparatus includes a darkroom () provided with an upper surface () having an opening portion (), a support device provided at the upper surface of the darkroom () to support the photovoltaic devices as an inspecting object () on the opening portion (), cameras (and) disposed inside the darkroom () for photographing the inspecting object (), and a moving device configured to move the cameras in the darkroom (). The moving device includes an x-axial guiding portion (), a motor () and a timing belt ().