The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2013

Filed:

Oct. 28, 2011
Applicants:

Woon Seong Kwon, Singapore, SG;

Nagarajan Ranganathan, Singapore, SG;

Inventors:

Woon Seong Kwon, Singapore, SG;

Nagarajan Ranganathan, Singapore, SG;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/306 (2006.01); B44C 1/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to embodiments of the present invention, a method of processing a wafer is provided. The wafer includes a plurality of through-wafer interconnects extending from a frontside surface of the wafer to a backside surface of the wafer. The method includes removing a part of wafer material of the back-side such that a portion of the wafer material between the through-wafer interconnects is removed, thereby exposing a portion of the through-wafer interconnects, forming a layer of low-k dielectric material between the through-wafer interconnects, and planarizing the layer of low-k dielectric material such that a surface of the portion of the through-wafer interconnect is exposed.


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