The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 2013

Filed:

Mar. 11, 2012
Applicants:

Jun Matsuhashi, Kanagawa, JP;

Naohiro Makihira, Kanagawa, JP;

Inventors:

Jun Matsuhashi, Kanagawa, JP;

Naohiro Makihira, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01); G01R 31/00 (2006.01); G01R 31/08 (2006.01); H01L 21/66 (2006.01); H01L 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

To improve the reliability in an electric inspection of a semiconductor device. When a movable pedestalis being positioned relative to an arrangement direction of a plurality of second contact pinsby a positioning pinwhich a socketincludes, a substrate conduction test is performed by bringing a first contact pininto contact with a pre-stack landof a wiring substrateand of the a lower packageand moreover bringing the second contact pininto contact with a solder ball, and thus the electric inspection can be performed by precisely positioning the first contact pinside and the second contact pinside. Then, the reliability of the electric inspection can be improved.


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