The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
Feb. 15, 2011
Motoshi Tanaka, Aichi, JP;
Kyoji Takeichi, Aichi, JP;
Motoshi Tanaka, Aichi, JP;
Kyoji Takeichi, Aichi, JP;
Nidek Co., Ltd., Aichi, JP;
Abstract
An eyeglass lens processing apparatus includes: a marking unit forming a mark on a lens; a mark position detector detecting a position of the mark; a controller performing roughing process and finishing process after the roughing process; and a positional deviation detector detecting a rotational deviation of the lens after the roughing process. The controller obtains a roughing path which allows, even if the lens rotates with respect to the lens chuck shafts by an angle at the time of the roughing process, the controller to perform the finishing process. The controller obtains an area in a process in which the mark and the target lens shape rotate on a chuck center of the lens chuck shafts by the angle, and computes the roughing path based on the area. The controller performs the roughing process based on the roughing path.