The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8601947 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 10, 2013

Filed:

Sep. 08, 2009
Applicants:

Michael Kaiser, Heidelberg, DE;

Frank Schumann, Heidelberg, DE;

Inventors:

Michael Kaiser, Heidelberg, DE;

Frank Schumann, Heidelberg, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41F 33/00 (2006.01); B41F 33/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and a method for evaluating control marks on printing materials by an optical sensor connected to a computer, which interprets overshooting of a predefined intensity threshold as it registers the printing material being a line of a printed control mark. The apparatus is distinguished by the fact that the control mark is registered by a color measuring instrument and that the intensity threshold of the optical sensor is calculated by the computer in dependence on the measured color value registered by the color measuring instrument.


Find Patent Forward Citations

Kaiser, Michael. (2013). Optimized-intensity control mark measurement and apparatus for performing the measurement (U.S. Patent No. 8601947). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8601947

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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