The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2013
Filed:
Dec. 08, 2011
Akira Makiuchi, Anjo, JP;
Ikuya Kato, Nagoya, JP;
Keita Goto, Okazaki, JP;
Yoshihiro Somyo, Okazaki, JP;
Kenichi Yabuki, Anjo, JP;
Akira Makiuchi, Anjo, JP;
Ikuya Kato, Nagoya, JP;
Keita Goto, Okazaki, JP;
Yoshihiro Somyo, Okazaki, JP;
Kenichi Yabuki, Anjo, JP;
JTEKT Corporation, Osaka-shi, JP;
Abstract
The positions of at least three points, which are circumferentially, and equiangularly, offset from each other, of a peripheral face of a workpiece set on a rotary table are measured using a position detection probe. The amount of runout of the axis of the workpiece and a phase position of the workpiece, at which the runout amount is largest, are calculated from the measured positions of the equiangularly offset points. The rotary table is turned to set the largest runout phase position of the workpiece in a position opposed to a workpiece contact of a centering apparatus. The relative positions of the workpiece and a position detection block are calculated using the position detection probe. The workpiece is centered by moving a centering shaft member of the centering apparatus such that the workpiece contact pushes the workpiece by a distance corresponding to the runout amount.