The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2013
Filed:
Sep. 24, 2012
Applicant:
Los Alamos National Security, Llc, Los Alamos, NM (US);
Inventors:
Mark J. Hagmann, West Valley, UT (US);
Dmitry A. Yarotski, Los Alamos, NM (US);
Assignee:
Los Alamos National Security, LLC, Los Alamos, NM (US);
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/10 (2010.01);
U.S. Cl.
CPC ...
Abstract
Apparatus for generating a microwave frequency comb (MFC) in the DC tunneling current of a scanning tunneling microscope (STM) by fast optical rectification, caused by nonlinearity of the DC current vs. voltage curve for the tunneling junction, of regularly-spaced, short pulses of optical radiation from a focused mode-locked, ultrafast laser, directed onto the tunneling junction, is described. Application of the MFC to high resolution dopant profiling in semiconductors is simulated. Application of the MFC to other measurements is described.