The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2013
Filed:
Dec. 30, 2010
Woo-sik Jeong, Gyeonggi-do, KR;
Kang-chil Lee, Gyeonggi-do, KR;
Jeong-ho Cho, Gyeonggi-do, KR;
Kyoung-shub Lee, Gyeonggi-do, KR;
Il-kwon Kang, Gyeonggi-do, KR;
Sungho Kang, Seoul, KR;
Joo Hwan Lee, Seoul, KR;
Woo-Sik Jeong, Gyeonggi-do, KR;
Kang-Chil Lee, Gyeonggi-do, KR;
Jeong-Ho Cho, Gyeonggi-do, KR;
Kyoung-Shub Lee, Gyeonggi-do, KR;
Il-Kwon Kang, Gyeonggi-do, KR;
Sungho Kang, Seoul, KR;
Joo Hwan Lee, Seoul, KR;
Hynix Semiconductor Inc., Gyeonggi-do, KR;
Abstract
A device for repair analysis includes a selection unit and an analysis unit. The selection unit is configured to select a part of the row addresses of a plurality of spare pivot fault cells and a part of the column addresses of the spare pivot fault cells in response to a control code. The analysis unit is configured to generate an analysis signal indicating whether row addresses of a plurality of non-spare pivot fault cells are included in selected row addresses and column addresses of the non-spare pivot fault cells are included in selected column addresses.