The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2013
Filed:
Nov. 04, 2009
Youichi Nonaka, Yokohama, JP;
Makoto Ono, Yokohama, JP;
Hisaya Ishibashi, Yokohama, JP;
Attila Lengyel, San Jose, CA (US);
Yuuichi Suginishi, Fujisawa, JP;
Tomotoshi Ishida, Hitachinaka, JP;
Youichi Nonaka, Yokohama, JP;
Makoto Ono, Yokohama, JP;
Hisaya Ishibashi, Yokohama, JP;
Attila Lengyel, San Jose, CA (US);
Yuuichi Suginishi, Fujisawa, JP;
Tomotoshi Ishida, Hitachinaka, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
Disclosed are a device, a system, and a method for setting standard work times that take real-world manufacturing capabilities into account. Provided is a standard work time calculation device (), which analyzes fluctuations in production line assessment indices on a per time period basis, and computes standard work times for each region, as classified according to the degree of fluctuation. The standard work time calculation device () comprises a fluctuation coefficient computation unit (), which computes coefficients of fluctuation for the assessment indices, a fluctuation region identification unit (), which identifies regions of fluctuation with coefficients of fluctuation that are greater than or equal to predetermined thresholds, and a standard work time computation unit (), which computes standard work times for regions of fluctuation.