The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2013
Filed:
Jun. 03, 2010
Athanasions Iliopoulos, Chevy Chase, MD (US);
John G. Michopoulos, Washington, DC (US);
Nikos Andrianopoulos, Athens, GR;
Athanasions Iliopoulos, Chevy Chase, MD (US);
John G. Michopoulos, Washington, DC (US);
Nikos Andrianopoulos, Athens, GR;
The United States of America as represented by the Secreatary of the Navy, Washington, DC (US);
Abstract
A computer-implemented method for measuring full field deformation characteristics of a deformable body. The method includes determining optical setup design parameters for measuring displacement and strain fields, and generating and applying a dot pattern on a planar side of a deformable body. A sequence of images of the dot pattern is acquired before and after deformation of the body. Irregular objects are eliminated from the images based on dot light intensity threshold and the object area or another geometrical cutoff criterion. The characteristic points of the dots are determined, and the characteristic points are matched between two or more of the sequential images. The displacement vector of the characteristic points is found, and mesh free or other techniques are used to estimate the full field displacement based on the displacement vector of the characteristic points. Strain tensor or other displacement-derived quantities can also be estimated using mesh-free or other analysis techniques.