The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8600117 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 03, 2013

Filed:

Dec. 09, 2009
Applicants:

Yi-fang LI, Tainan, TW;

Szu-hsuan Wang, Kaohsiung, TW;

Inventors:

Yi-Fang Li, Tainan, TW;

Szu-Hsuan Wang, Kaohsiung, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An automatic measurement system for plant features includes: at least one photographic device, for photographing a plant in a container, so as to generate a top view image and a side view image; and an operation processing device, electrically connected to the photographic devices, and at least including an image processing module and a storage unit. The image processing module analyzes at least one of the top view image and the side view image by using at least one image processing procedure and at least one analysis rule, so as to generate at least one feature data corresponding to appearance features of the plant, and records the at least one feature data in the storage unit.


Find Patent Forward Citations

Li, Yi-Fang. (2013). Automatic measurement system and method for plant features, and recording medium thereof (U.S. Patent No. 8600117). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8600117

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