The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2013

Filed:

Nov. 12, 2010
Applicants:

Andrew Joo Kim, Atlanta, GA (US);

Seungmok OH, Atlanta, GA (US);

Matthew Kuhn, Atlanta, GA (US);

Bob Nayar, Suwanee, GA (US);

Youngsik Hur, Atlanta, GA (US);

Inventors:

Andrew Joo Kim, Atlanta, GA (US);

Seungmok Oh, Atlanta, GA (US);

Matthew Kuhn, Atlanta, GA (US);

Bob Nayar, Suwanee, GA (US);

Youngsik Hur, Atlanta, GA (US);

Assignee:

Samsung Electro-Mechanics, Gyunngi-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 27/06 (2006.01); H04N 5/44 (2011.01);
U.S. Cl.
CPC ...
Abstract

A received RF signal is down-converted to a baseband or low-IF digitized signal in order to search for a pilot signal that indicates a presence of a DTV signal such as an ATSC DTV signal. The pilot signal characteristically resides in a fixed frequency range for all valid DTV signals and is extracted by processing the baseband or low-IF signal in multiple stages. The first stage reduces signal information to that pertaining to the frequency band covering all valid pilot frequencies, thereby reducing the sampling rate and computational complexity of subsequent operations. A second stage operates on this reduced rate signal to focus on a series of particular pilot frequencies for interrogation. For each such candidate frequency, the cyclostationarity of the signal is measured and tested for statistical significance relative to the background energy to yield an effective test that is invariant with respect to background noise level.


Find Patent Forward Citations

Loading…