The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2013
Filed:
Feb. 26, 2008
Vladimir M. Shalaev, West Lafayette, IN (US);
Alexander P. Kildishev, West Lafayette, IN (US);
Vladimir P. Drachev, West Lafayette, IN (US);
Wenshan Cai, Sunnyvale, CA (US);
Vladimir M. Shalaev, West Lafayette, IN (US);
Alexander P. Kildishev, West Lafayette, IN (US);
Vladimir P. Drachev, West Lafayette, IN (US);
Wenshan Cai, Sunnyvale, CA (US);
Purdue Research Foundation, West Lafayette, IN (US);
Abstract
A tunable super-lens (TSL) for nanoscale optical sensing and imaging of bio-molecules and nano-manufacturing utilizes negative-index materials (NIMs) that operate in the visible or near infrared light. The NIMs can create a lens that will perform sub-wavelength imaging, enhanced resolution imaging, or flat lens imaging. This new TSL covers two different operation scales. For short distances between the object and its image, a near-field super-lens (NFSL) can create or enhance images of objects located at distances much less than the wavelength of light. For the far-zone, negative values are necessary for both the permittivity ∈ a permeability μ. While well-structured periodic meta-materials, which require delicate design and precise fabrication, can be used, metal-dielectric composites are also candidates for NIMs in the optical range. The negative-refraction in the composite films can be made by using frequency-selective photomodification.